Enum gfx_hal::command::AttachmentClear
source · pub enum AttachmentClear {
Color {
index: usize,
value: ClearColor,
},
DepthStencil {
depth: Option<DepthValue>,
stencil: Option<StencilValue>,
},
}
Expand description
Attachment clear description for the current subpass.
Variants
Color
Clear color attachment.
DepthStencil
Fields
depth: Option<DepthValue>
Depth value to clear with.
stencil: Option<StencilValue>
Stencil value to clear with.
Clear depth-stencil attachment.
Trait Implementations
sourceimpl Clone for AttachmentClear
impl Clone for AttachmentClear
sourcefn clone(&self) -> AttachmentClear
fn clone(&self) -> AttachmentClear
Returns a copy of the value. Read more
1.0.0 · sourcefn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source
. Read moresourceimpl Debug for AttachmentClear
impl Debug for AttachmentClear
sourceimpl PartialEq<AttachmentClear> for AttachmentClear
impl PartialEq<AttachmentClear> for AttachmentClear
sourcefn eq(&self, other: &AttachmentClear) -> bool
fn eq(&self, other: &AttachmentClear) -> bool
sourceimpl PartialOrd<AttachmentClear> for AttachmentClear
impl PartialOrd<AttachmentClear> for AttachmentClear
sourcefn partial_cmp(&self, other: &AttachmentClear) -> Option<Ordering>
fn partial_cmp(&self, other: &AttachmentClear) -> Option<Ordering>
1.0.0 · sourcefn le(&self, other: &Rhs) -> bool
fn le(&self, other: &Rhs) -> bool
This method tests less than or equal to (for
self
and other
) and is used by the <=
operator. Read moreimpl Copy for AttachmentClear
impl StructuralPartialEq for AttachmentClear
Auto Trait Implementations
impl RefUnwindSafe for AttachmentClear
impl Send for AttachmentClear
impl Sync for AttachmentClear
impl Unpin for AttachmentClear
impl UnwindSafe for AttachmentClear
Blanket Implementations
sourceimpl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
const: unstable · sourcefn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more