Struct flo_render_gl_offscreen::winapi::um::wingdi::OUTLINETEXTMETRICW
source · pub struct OUTLINETEXTMETRICW {Show 32 fields
pub otmSize: u32,
pub otmTextMetrics: TEXTMETRICW,
pub otmFiller: u8,
pub otmPanoseNumber: PANOSE,
pub otmfsSelection: u32,
pub otmfsType: u32,
pub otmsCharSlopeRise: i32,
pub otmsCharSlopeRun: i32,
pub otmItalicAngle: i32,
pub otmEMSquare: u32,
pub otmAscent: i32,
pub otmDescent: i32,
pub otmLineGap: u32,
pub otmsCapEmHeight: u32,
pub otmsXHeight: u32,
pub otmrcFontBox: RECT,
pub otmMacAscent: i32,
pub otmMacDescent: i32,
pub otmMacLineGap: u32,
pub otmusMinimumPPEM: u32,
pub otmptSubscriptSize: POINT,
pub otmptSubscriptOffset: POINT,
pub otmptSuperscriptSize: POINT,
pub otmptSuperscriptOffset: POINT,
pub otmsStrikeoutSize: u32,
pub otmsStrikeoutPosition: i32,
pub otmsUnderscoreSize: i32,
pub otmsUnderscorePosition: i32,
pub otmpFamilyName: *mut i8,
pub otmpFaceName: *mut i8,
pub otmpStyleName: *mut i8,
pub otmpFullName: *mut i8,
}
Fields§
§otmSize: u32
§otmTextMetrics: TEXTMETRICW
§otmFiller: u8
§otmPanoseNumber: PANOSE
§otmfsSelection: u32
§otmfsType: u32
§otmsCharSlopeRise: i32
§otmsCharSlopeRun: i32
§otmItalicAngle: i32
§otmEMSquare: u32
§otmAscent: i32
§otmDescent: i32
§otmLineGap: u32
§otmsCapEmHeight: u32
§otmsXHeight: u32
§otmrcFontBox: RECT
§otmMacAscent: i32
§otmMacDescent: i32
§otmMacLineGap: u32
§otmusMinimumPPEM: u32
§otmptSubscriptSize: POINT
§otmptSubscriptOffset: POINT
§otmptSuperscriptSize: POINT
§otmptSuperscriptOffset: POINT
§otmsStrikeoutSize: u32
§otmsStrikeoutPosition: i32
§otmsUnderscoreSize: i32
§otmsUnderscorePosition: i32
§otmpFamilyName: *mut i8
§otmpFaceName: *mut i8
§otmpStyleName: *mut i8
§otmpFullName: *mut i8
Trait Implementations§
source§impl Clone for OUTLINETEXTMETRICW
impl Clone for OUTLINETEXTMETRICW
source§fn clone(&self) -> OUTLINETEXTMETRICW
fn clone(&self) -> OUTLINETEXTMETRICW
Returns a copy of the value. Read more
1.0.0 · source§fn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source
. Read more