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#![no_std]
#![forbid(unsafe_code)]
use self::config::{SensorMode, Variant};
use bitfields::RawConfig;
use constants::{
CYCLE_DURATION, GAS_MEAS_DURATION, LEN_CONFIG, TPH_SWITCHING_DURATION, WAKEUP_DURATION,
};
use data::CalibrationData;
use embedded_hal::{
blocking::delay::DelayMs,
blocking::i2c::{Write, WriteRead},
};
use i2c_helper::I2CHelper;
pub use self::config::{Configuration, DeviceAddress, GasConfig, IIRFilter, Oversampling};
use crate::data::{calculate_humidity, calculate_pressure, calculate_temperature};
pub use data::MeasurmentData;
pub use error::BmeError;
mod bitfields;
mod calculations;
mod config;
mod constants;
mod data;
mod error;
mod i2c_helper;
pub struct Bme680<I2C, D> {
i2c: i2c_helper::I2CHelper<I2C, D>,
calibration_data: CalibrationData,
sensor_config: RawConfig<[u8; LEN_CONFIG]>,
variant: Variant,
}
impl<I2C, D> Bme680<I2C, D>
where
I2C: WriteRead + Write,
<I2C as WriteRead>::Error: core::fmt::Debug,
<I2C as Write>::Error: core::fmt::Debug,
D: DelayMs<u8>,
{
pub fn new(
i2c_interface: I2C,
device_address: DeviceAddress,
delayer: D,
sensor_config: &Configuration,
ambient_temperature: i32,
) -> Result<Self, BmeError<I2C>> {
let mut i2c = I2CHelper::new(i2c_interface, device_address, delayer, ambient_temperature)?;
let calibration_data = i2c.get_calibration_data()?;
let sensor_config = i2c.set_config(sensor_config, &calibration_data)?;
let variant = i2c.get_variant_id()?;
let bme = Self {
i2c,
calibration_data,
sensor_config,
variant,
};
Ok(bme)
}
pub fn into_inner(self) -> I2C {
self.i2c.into_inner()
}
fn put_to_sleep(&mut self) -> Result<(), BmeError<I2C>> {
self.i2c.set_mode(SensorMode::Sleep)
}
pub fn set_configuration(&mut self, config: &Configuration) -> Result<(), BmeError<I2C>> {
self.put_to_sleep()?;
let new_config = self.i2c.set_config(config, &self.calibration_data)?;
self.sensor_config = new_config;
Ok(())
}
pub fn measure(&mut self) -> Result<MeasurmentData, BmeError<I2C>> {
self.i2c.set_mode(SensorMode::Forced)?;
let delay_period = self.calculate_delay_period_us();
self.i2c.delay(delay_period / 1000);
for _i in 0..5 {
let raw_data = self.i2c.get_field_data()?;
if !raw_data.measuring() && raw_data.new_data() {
let (temperature, t_fine) =
calculate_temperature(raw_data.temperature_adc().0, &self.calibration_data);
self.i2c.ambient_temperature = temperature as i32;
let pressure =
calculate_pressure(raw_data.pressure_adc().0, &self.calibration_data, t_fine);
let humidity =
calculate_humidity(raw_data.humidity_adc().0, &self.calibration_data, t_fine);
let gas_resistance = if raw_data.gas_valid() && !raw_data.gas_measuring() {
let gas_resistance = self.variant.calc_gas_resistance(
raw_data.gas_adc().0,
self.calibration_data.range_sw_err,
raw_data.gas_range() as usize,
);
Some(gas_resistance)
} else {
None
};
let data = MeasurmentData {
temperature,
gas_resistance,
humidity,
pressure,
};
return Ok(data);
} else {
self.i2c.delay(delay_period);
}
}
Err(BmeError::MeasuringTimeOut)
}
fn calculate_delay_period_us(&self) -> u32 {
let mut measurment_cycles: u32 = 0;
measurment_cycles += self.sensor_config.temperature_oversampling().cycles();
measurment_cycles += self.sensor_config.humidity_oversampling().cycles();
measurment_cycles += self.sensor_config.pressure_oversampling().cycles();
let mut measurment_duration = measurment_cycles * CYCLE_DURATION;
measurment_duration += TPH_SWITCHING_DURATION;
measurment_duration += GAS_MEAS_DURATION;
measurment_duration += WAKEUP_DURATION;
measurment_duration
}
}
#[cfg(test)]
mod library_tests {
extern crate std;
use std::vec;
use std::vec::Vec;
use crate::constants::{
ADDR_CHIP_ID, ADDR_CONFIG, ADDR_CONTROL_MODE, ADDR_GAS_WAIT_0, ADDR_REG_COEFF1,
ADDR_REG_COEFF2, ADDR_REG_COEFF3, ADDR_RES_HEAT_0, ADDR_SOFT_RESET, ADDR_VARIANT_ID,
CHIP_ID, CMD_SOFT_RESET, LEN_COEFF1, LEN_COEFF2, LEN_COEFF3,
};
use crate::i2c_helper::extract_calibration_data;
const CALIBRATION_DATA: [u8; 42] = [
179, 193, 176, 188, 21, 51, 11, 29, 222, 179, 184, 1, 230, 47, 209, 22, 154, 34, 237, 70,
148, 134, 44, 13, 204, 61, 206, 69, 18, 43, 124, 164, 92, 132, 19, 63, 29, 28, 201, 140,
70, 24,
];
use super::*;
use embedded_hal_mock::delay::MockNoop;
use embedded_hal_mock::i2c::{Mock as I2cMock, Transaction as I2cTransaction};
use test_log::test;
fn setup_transactions() -> Vec<I2cTransaction> {
let mut transactions = vec![];
let calibration_data_1 = CALIBRATION_DATA[0..LEN_COEFF1].to_vec();
let calibration_data_2 = CALIBRATION_DATA[LEN_COEFF1..LEN_COEFF1 + LEN_COEFF2].to_vec();
let calibration_data_3 = CALIBRATION_DATA
[LEN_COEFF1 + LEN_COEFF2..LEN_COEFF1 + LEN_COEFF2 + LEN_COEFF3]
.to_vec();
assert!(calibration_data_1.len() == LEN_COEFF1);
assert!(calibration_data_2.len() == LEN_COEFF2);
assert!(calibration_data_3.len() == LEN_COEFF3);
transactions.push(I2cTransaction::write(
DeviceAddress::Primary.into(),
vec![ADDR_SOFT_RESET, CMD_SOFT_RESET],
));
transactions.push(I2cTransaction::write_read(
DeviceAddress::Primary.into(),
vec![ADDR_CHIP_ID],
vec![CHIP_ID],
));
transactions.push(I2cTransaction::write_read(
DeviceAddress::Primary.into(),
vec![ADDR_REG_COEFF1],
calibration_data_1,
));
transactions.push(I2cTransaction::write_read(
DeviceAddress::Primary.into(),
vec![ADDR_REG_COEFF2],
calibration_data_2,
));
transactions.push(I2cTransaction::write_read(
DeviceAddress::Primary.into(),
vec![ADDR_REG_COEFF3],
calibration_data_3,
));
let default_config = [0u8; 5];
transactions.push(I2cTransaction::write_read(
DeviceAddress::Primary.into(),
vec![ADDR_CONFIG],
default_config.into(),
));
let user_config = Configuration::default();
let mut raw_config = RawConfig(default_config);
raw_config.apply_config(&user_config);
raw_config
.0
.into_iter()
.enumerate()
.for_each(|(register_offset, register_content)| {
transactions.push(I2cTransaction::write(
DeviceAddress::Primary.into(),
vec![ADDR_CONFIG + register_offset as u8, register_content],
));
});
let gas_config = user_config.gas_config.unwrap();
let gas_wait_0 = gas_config.calc_gas_wait();
let res_heat_0 = gas_config.calc_res_heat(&extract_calibration_data(CALIBRATION_DATA), 20);
transactions.push(I2cTransaction::write(
DeviceAddress::Primary.into(),
vec![ADDR_GAS_WAIT_0, gas_wait_0],
));
transactions.push(I2cTransaction::write(
DeviceAddress::Primary.into(),
vec![ADDR_RES_HEAT_0, res_heat_0],
));
transactions.push(I2cTransaction::write_read(
DeviceAddress::Primary.into(),
vec![ADDR_VARIANT_ID],
vec![0],
));
transactions
}
fn add_sleep_to_sleep_transactions(transactions: &mut Vec<I2cTransaction>) {
transactions.push(I2cTransaction::write_read(
DeviceAddress::Primary.into(),
vec![ADDR_CONTROL_MODE],
vec![0b101011_00],
));
}
#[test]
fn test_setup() {
let transactions = setup_transactions();
let i2c_interface = I2cMock::new(&transactions);
let bme = Bme680::new(
i2c_interface,
DeviceAddress::Primary,
MockNoop::new(),
&Configuration::default(),
20,
)
.unwrap();
bme.into_inner().done();
}
#[test]
fn test_set_mode_forced_to_sleep() {
let mut transactions = setup_transactions();
transactions.push(I2cTransaction::write_read(
DeviceAddress::Primary.into(),
vec![ADDR_CONTROL_MODE],
vec![0b101011_01],
));
transactions.push(I2cTransaction::write(
DeviceAddress::Primary.into(),
vec![ADDR_CONTROL_MODE, 0b101011_00],
));
transactions.push(I2cTransaction::write_read(
DeviceAddress::Primary.into(),
vec![ADDR_CONTROL_MODE],
vec![0b101011_00],
));
let i2c_interface = I2cMock::new(&transactions);
let mut bme = Bme680::new(
i2c_interface,
DeviceAddress::Primary,
MockNoop::new(),
&Configuration::default(),
20,
)
.unwrap();
bme.put_to_sleep().unwrap();
bme.into_inner().done();
}
#[test]
fn test_set_mode_sleep_to_sleep() {
let mut transactions = setup_transactions();
add_sleep_to_sleep_transactions(&mut transactions);
let i2c_interface = I2cMock::new(&transactions);
let mut bme = Bme680::new(
i2c_interface,
DeviceAddress::Primary,
MockNoop::new(),
&Configuration::default(),
20,
)
.unwrap();
bme.put_to_sleep().unwrap();
bme.into_inner().done();
}
}