Module atsamv71q20::mcan0::mcan_test

source · [−]
Expand description

Test Register

Structs

LBCK_R

Field LBCK reader - Loop Back Mode (read/write)

LBCK_W

Field LBCK writer - Loop Back Mode (read/write)

MCAN_TEST_SPEC

Test Register

R

Register MCAN_TEST reader

RX_R

Field RX reader - Receive Pin (read-only)

RX_W

Field RX writer - Receive Pin (read-only)

TDCV_R

Field TDCV reader - Transceiver Delay Compensation Value (read-only)

TDCV_W

Field TDCV writer - Transceiver Delay Compensation Value (read-only)

TX_R

Field TX reader - Control of Transmit Pin (read/write)

TX_W

Field TX writer - Control of Transmit Pin (read/write)

W

Register MCAN_TEST writer

Enums

LBCK_A

Loop Back Mode (read/write)

TX_A

Control of Transmit Pin (read/write)